GLY 4200C                             Word List for Final Examination

Mineralogy

The final examination will be given on Friday, November 30, 2012 at 7:45 - 10:15 a.m. It will cover the following pages of the assigned reading:

K & D, Chapter 11, 245-262

K & D, Chapter 13

K & D, Chapter 14, 307-321

X-ray Crystallography lecture notes

In addition, the material in the lecture will be tested, as will homework exercises #5-10.

Be sure to bring a calculator and a centimeter ruler to the exam. The final examination is worth 18% of the total course grade. It will include review material from the midterms. Up to 20% of the points on the final may come from the midterms. Be sure to understand the questions you missed, not just memorize the answers.

Thermodynamics

System

Surroundings

Enthalpy

Entropy

Gibbs free energy

            Equation

Coefficient of isothermal compressibility

Heat Capacity

Effects of P and T changes

Phase Rule

Phase

Reaction

Component

Degree of Freedom

J. Willard Gibbs

Equilibrium

Unary Diagrams

One component system

            Water

Triple point

Water ice

Silica

Carbon

Types of phase boundaries

T-P Diagrams

Binary Diagrams

Two component system

Liquidus

Solidus

End member

Solid solution

            Olivine

Plagioclase

Zoning

Binary eutectic with congruent melting

K-spar - silica

Binary eutectic with incongruent melting

            Peritectic

Leucite - K-spar - silica

Fosterite - Enstatite - Silica

Minimum Melting Point

            With and without solvus

K-spar - Albite

Ex-solution

Fractionation

Lever Rule

Effect of Pressure on Phase Diagrams where pressure is no a variable

Ternary Diagrams

Properties of Light

Speed of light

Wavelength

Frequency

Index of Refraction

Reflection

Refraction

Snell's Law - named after Dutch mathematician Willebrord Snellius

Brewster's Angle - named after Scottish physicist Sir David Brewster

Critical Angle

Dispersion

            Cauchy’s equation - for French mathematician Augustin Louis Cauchy

Solar spectral lines

Fraunhofer designation - named after German physicist Joseph von Fraunhofer

Dispersive Power

Coefficient of dispersion

Normal and anomalous dispersion

Constructive interference - in phase

Destructive interference - out of phase

Isotropic media

Anisotropic media

Optical Properties of Minerals

Path difference

Ordinary ray

Extraordinary ray

Accessory plates (compensators)

1° red, gypsum, quartz sensitive tint Δ = 550 nm

Mica, quarter-wave plate Δ = 150 nm

Quartz wedge Variable over several orders

Retardation

            Δ = c(T_N - T_n)

Percent transmission

CN

PN

High-order vs. 1° white

Addition

Subtraction

Orthoscopic

Conoscopic

Angular aperture

Numerical aperture

Index of refraction oils

Extinction angle

Parallel

Inclined

Symmetric

Natural Color

Absorption

Pleochroism

Optical Indicatrix

Construction of an Indicatrix - Sir Lazarus Fletcher

Isotropic Indicatrix

Spherical

Uniaxial Indicatrix

Hexagonal and Tetragonal Systems

Biaxial ellipsoid

Positive and negative

Indices - ε and ω

Prolate and oblate ellipsoids

Circular section

Optic axis

Principal and random sections

Wave Normal

Explanation of double refraction

            Ordinary and Extraordinary rays 

Orthoscopic versus conoscopic observation

Biaxial Indicatrix

Triaxial ellipsoid

Orthorhombic, monoclinic, or triclinic systems

X, Y, Z optical axes

x, y, z crystallographic axes

α, β, γ indices of refraction

X', Z' intermediate directions

α', γ' intermediate indices

γ>γ'>β>α'>α

Birefringence

Optical Axial Plane (OAP)

Optic Normal (ON)

Circular Sections

Optic Axes

Acute bisectrix - B_xa

Obtuse bisectrix - B_xo

2V - definition

2V = 90°

Principal plane

Extinction types

Parallel

Symmetric

Continuous

Inclined

Undulatory

X-rays and X-ray Mineralogy

X-ray - 10^-6 -10^-1 nm

Soft

Hard

Relationship between wavelength and excitation energy

Einstein equation

X-ray tube - schematic diagram

Reason for cooling

Target materials

Method for X-ray production

Be or Al port covers

Continuous spectrum (white radiation)

Effect of excitation potential on minimum wavelength

Peaks - K_α1, K_α2, K_β1, K_β2, etc.

Characteristic radiation

Produced by electron infalls

Shells - K,L,M,N,O, etc.

Filtration - absorption edge

Max von Laue - German physicist, discoverer of diffraction of X-rays by crystals

Laue equations

Diffraction

Bragg equation - discovered by Sir William Lawrence Bragg and his father, Sir William Henry Bragg

“Reflection”

Glancing angle of incidence

Identity Periods

Single Crystal Methods

Major Goal: Structure determination

Secondary goals

Confirmation of mineral identity

Clearing up ambiguities in mineral nomenclature

Laue

Rotation

Weissenberg - Karl Weissenberg

Precession - Martin Julian Buerger

Single Crystal diffractometer

Powder methods

Mounting methods

Debye-Scherier

Hägg-Guinier

Powder diffractometer

Microdensiometer

Major Goal - Mineral Identification

Secondary Goals

Composition of minerals in solid solution series

Estimation of mineral phase percentages in rocks

Rietveld refinement method - crystal structure from powder data

Suitable minerals

Clay

Some zeolites

Iron and manganese oxides and hydroxides

Must have reasonable “starting model’ of the crystal structure

Advantages of Powder method

ICDD - International Center for Diffraction Data

PDF - Powder Diffraction File

Questions or comments? mailto:warburto@fau.edu

Last updated: October 30, 2012